drm/rockchip: dw-dp: print sink request info when autotest SI

Change-Id: Ib54270da1e9e823a65b0cd5e4363a823e865ede1
Signed-off-by: Zhang Yubing <yubing.zhang@rock-chips.com>
This commit is contained in:
Zhang Yubing
2024-05-28 10:20:32 +08:00
committed by 张玉炳
parent 1eab7dd4f8
commit 74016d114b

View File

@@ -4591,7 +4591,7 @@ static void dw_dp_handle_test_request(struct dw_dp *dp)
switch (request) {
case DP_TEST_LINK_PHY_TEST_PATTERN:
dev_dbg(dp->dev, "PHY_PATTERN test requested\n");
dev_info(dp->dev, "PHY_PATTERN test requested\n");
response = dw_dp_autotest_phy_pattern(dp);
break;
default:
@@ -4644,13 +4644,13 @@ static void dw_dp_phy_pattern_update(struct dw_dp *dp)
switch (data->phy_pattern) {
case DP_PHY_TEST_PATTERN_NONE:
dev_dbg(dp->dev, "Disable Phy Test Pattern\n");
dev_info(dp->dev, "Disable Phy Test Pattern\n");
regmap_update_bits(dp->regmap, DPTX_CCTL, SCRAMBLE_DIS,
FIELD_PREP(SCRAMBLE_DIS, 1));
dw_dp_phy_set_pattern(dp, DPTX_PHY_PATTERN_NONE);
break;
case DP_PHY_TEST_PATTERN_D10_2:
dev_dbg(dp->dev, "Set D10.2 Phy Test Pattern\n");
dev_info(dp->dev, "Set D10.2 Phy Test Pattern\n");
regmap_update_bits(dp->regmap, DPTX_CCTL, SCRAMBLE_DIS,
FIELD_PREP(SCRAMBLE_DIS, 1));
dw_dp_phy_set_pattern(dp, DPTX_PHY_PATTERN_TPS_1);
@@ -4658,17 +4658,17 @@ static void dw_dp_phy_pattern_update(struct dw_dp *dp)
case DP_PHY_TEST_PATTERN_ERROR_COUNT:
regmap_update_bits(dp->regmap, DPTX_CCTL, SCRAMBLE_DIS,
FIELD_PREP(SCRAMBLE_DIS, 0));
dev_dbg(dp->dev, "Set Error Count Phy Test Pattern\n");
dev_info(dp->dev, "Set Error Count Phy Test Pattern\n");
dw_dp_phy_set_pattern(dp, DPTX_PHY_PATTERN_SERM);
break;
case DP_PHY_TEST_PATTERN_PRBS7:
dev_dbg(dp->dev, "Set PRBS7 Phy Test Pattern\n");
dev_info(dp->dev, "Set PRBS7 Phy Test Pattern\n");
regmap_update_bits(dp->regmap, DPTX_CCTL, SCRAMBLE_DIS,
FIELD_PREP(SCRAMBLE_DIS, 1));
dw_dp_phy_set_pattern(dp, DPTX_PHY_PATTERN_PBRS7);
break;
case DP_PHY_TEST_PATTERN_80BIT_CUSTOM:
dev_dbg(dp->dev, "Set 80Bit Custom Phy Test Pattern\n");
dev_info(dp->dev, "Set 80Bit Custom Phy Test Pattern\n");
regmap_update_bits(dp->regmap, DPTX_CCTL, SCRAMBLE_DIS,
FIELD_PREP(SCRAMBLE_DIS, 1));
regmap_write(dp->regmap, DPTX_CUSTOMPAT0, 0x3e0f83e0);
@@ -4677,13 +4677,13 @@ static void dw_dp_phy_pattern_update(struct dw_dp *dp)
dw_dp_phy_set_pattern(dp, DPTX_PHY_PATTERN_CUSTOM_80BIT);
break;
case DP_PHY_TEST_PATTERN_CP2520:
dev_dbg(dp->dev, "Set HBR2 compliance Phy Test Pattern\n");
dev_info(dp->dev, "Set HBR2 compliance Phy Test Pattern\n");
regmap_update_bits(dp->regmap, DPTX_CCTL, SCRAMBLE_DIS,
FIELD_PREP(SCRAMBLE_DIS, 0));
dw_dp_phy_set_pattern(dp, DPTX_PHY_PATTERN_CP2520_1);
break;
case DP_PHY_TEST_PATTERN_SEL_MASK:
dev_dbg(dp->dev, "Set TPS4 Phy Test Pattern\n");
dev_info(dp->dev, "Set TPS4 Phy Test Pattern\n");
regmap_update_bits(dp->regmap, DPTX_CCTL, SCRAMBLE_DIS,
FIELD_PREP(SCRAMBLE_DIS, 0));
dw_dp_phy_set_pattern(dp, DPTX_PHY_PATTERN_TPS_4);
@@ -4718,7 +4718,7 @@ static void dw_dp_process_phy_request(struct dw_dp *dp)
dw_dp_phy_pattern_update(dp);
drm_dp_set_phy_test_pattern(&dp->aux, data, link_status[DP_DPCD_REV]);
dev_dbg(dp->dev, "phy test rate:%d, lane count:%d, ssc:%d, vs:%d, pe: %d\n",
dev_info(dp->dev, "phy test rate:%d, lane count:%d, ssc:%d, vs:%d, pe: %d\n",
data->link_rate, data->num_lanes, spread, dp->link.train.adjust.voltage_swing[0],
dp->link.train.adjust.pre_emphasis[0]);
}